Clock Grouping: A Low Cost DFT Methodology for Delay Testing.
Wen-Chang FangSandeep K. GuptaPublished in: DAC (1994)
Keyphrases
- machine learning
- low cost
- low power
- learning algorithm
- test cases
- frequency domain
- testing process
- perceptual grouping
- software testing
- high speed
- website
- control system
- multiscale
- image reconstruction
- data acquisition
- power consumption
- digital camera
- computer vision
- rfid tags
- information retrieval
- neural network
- real time