Login / Signup
Automatic test pattern generation for delay defects using timed characteristic functions.
Shin-Yann Ho
Shuo-Ren Lin
Ko-Lung Yuan
Chien-Yen Kuo
Kuan-Yu Liao
Jie-Hong R. Jiang
Chien-Mo James Li
Published in:
ICCAD (2013)
Keyphrases
</>
semi automatic
fully automatic
databases
artificial intelligence
markov chain
petri net
search engine
data driven
defect detection