Hot carrier reliability in ultra-scaled sige channel p-FinFETs.

Miaomiao Wang Xin Miao James H. Stathis Richard G. Southwick

Published in: ASICON (2017)

Keyphrases

dual channel
high speed
multi channel
thin film
software reliability
knowledge base
decision trees
case study
mimo systems
channel capacity
genetic algorithm
information systems
steady state
databases
highly reliable
reliability analysis
antenna array