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High voltage degradation of GaN High Electron Mobility Transistors on silicon substrate.
Sefa Demirtas
Jungwoo Joh
Jesús A. del Alamo
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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high voltage
high density
semiconductor devices
electron beam
operating conditions
space charge
normal operation
high speed
partial discharge
low power
low cost
cmos technology
metal oxide semiconductor
data sets
integrated circuit
power consumption
decision trees