Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model.
Halil KüknerPieter WeckxPraveen RaghavanBen KaczerFrancky CatthoorLiesbet Van der PerreRudy LauwereinsGuido GroesenekenPublished in: Microprocess. Microsystems (2013)