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Testing high-performance pipelined circuits with slow-speed testers.

Muhammad NummerManoj Sachdev
Published in: ACM Trans. Design Autom. Electr. Syst. (2003)
Keyphrases
  • test cases
  • high speed
  • software testing
  • real time
  • neural network
  • data flow
  • cost effective
  • high reliability
  • digital circuits
  • delay insensitive
  • search engine
  • artificial neural networks
  • test set
  • power dissipation