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Electronic Testing for SOC Designers (Tutorial Abstract).

Vishwani D. AgrawalMichael L. Bushnell
Published in: VLSI Design (2002)
Keyphrases
  • high level
  • conceptual design
  • bulletin board
  • machine learning
  • low power
  • hardware and software
  • database
  • neural network
  • learning algorithm
  • social networks
  • information systems
  • case study
  • low level
  • test set
  • test cases