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Comprehensive Analysis of Gate-Induced Drain Leakage in Emerging FET Architectures: Nanotube FETs Versus Nanowire FETs.
Shubham Sahay
Mamidala Jagadesh Kumar
Published in:
IEEE Access (2017)
Keyphrases
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comprehensive analysis
data mining
field effect transistors
multiresolution
leakage current
neural network
multimedia content analysis
emerging trends
mac protocol
high density
video retrieval
parallel processing
low cost
evolutionary algorithm
mobile devices
social networks
artificial intelligence