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Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability.

Yasumasa TsukamotoKoji NiiSusumu ImaokaYuji OdaShigeki OhbayashiTomoaki YoshizawaHiroshi MakinoKoichiro IshibashiHirofumi Shinohara
Published in: ICCAD (2005)
Keyphrases
  • high density
  • worst case analysis
  • read write
  • low density
  • average case
  • worst case
  • data center
  • power consumption
  • random access memory
  • greedy heuristic
  • np hardness
  • objective function
  • np hard
  • lower bound
  • special case