Fault-Injection Analysis to Estimate SEU Failure in Time by Using Frame-Based Partial Reconfiguration.
Yoshihiro IchinomiyaTsuyoshi KimuraMotoki AmagasakiMorihiro KugaMasahiro IidaToshinori SueyoshiPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2012)
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