Login / Signup
Low-cost on-chip measurements for Oscillation-Based-Test in Analog Integrated Circuits.
Diego Vázquez
Gloria Huertas
Adoración Rueda
Gildas Léger
José L. Huertas
Published in:
LATW (2002)
Keyphrases
</>
integrated circuit
low cost
built in self test
analog vlsi
metal oxide semiconductor
printed circuit boards
digital camera
single chip
low power
circuit design
electron beam
hardware and software
low power consumption
high speed
signal processing
real time
embedded systems
image analysis
mixed signal