ChangeChip: A Reference-Based Unsupervised Change Detection for PCB Defect Detection.

Yehonatan Fridman Matan Rusanovsky Gal Oren

Published in: CoRR (2021)

Keyphrases

defect detection
feature extraction
automated visual inspection
computer vision
textured surfaces
artificial intelligence
clustering algorithm
search algorithm
reference images
reference frame
artificial neural networks
digital libraries
pattern recognition
real time
multiscale
bayesian networks
metadata
real world