Low Power Test Set Embedding Based on Phase Shifters.
Maciej BellosDimitri KagarisDimitris NikolosPublished in: ISVLSI (2003)
Keyphrases
- test set
- low power
- power consumption
- high speed
- low cost
- training set
- error rate
- high power
- single chip
- training data
- wireless transmission
- vlsi architecture
- digital signal processing
- test data
- vlsi circuits
- low power consumption
- logic circuits
- power reduction
- database
- evaluation methodology
- cmos technology
- delay insensitive
- nm technology
- image processing
- feature selection
- real time