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A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by Self-Activated Bitline Sensing.
Shien-Chun Luo
Lih-Yih Chiou
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2010)
Keyphrases
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lightweight
sensor networks
power system
power consumption
low voltage
real time
data transmission
access control
monitoring system
highly scalable
random access
web scale
failure rate
failure prediction
high voltage