A Parallel Algorithm for VLSI Test Generation.
Muralidhar MedidiAssim SagahyroonPublished in: Parallel and Distributed Computing and Systems (1995)
Keyphrases
- parallel algorithm
- test generation
- processor array
- test cases
- symbolic execution
- design automation
- shared memory
- quality assurance
- parallel programming
- static analysis
- parallel computation
- parallel computers
- software testing
- code coverage
- binary search trees
- relational databases
- parallel implementations
- medial axis transform
- discovery of association rules
- search algorithm