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Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits.

Florent CiliciManuel J. BarraganSalvador MirEstelle Lauga-LarrozeSylvain Bourdel
Published in: ETS (2018)
Keyphrases
  • machine learning
  • artificial intelligence
  • computer graphics
  • millimeter wave
  • built in self test