Computer-aided redesign of VLSI circuits for hot-carrier reliability.
Ping-Chung LiIbrahim N. HajjPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
- computer aided
- vlsi circuits
- fault tree
- computer assisted
- computer aided diagnosis
- computer aided design
- low power
- diagnosis of breast cancer
- image analysis
- high speed
- design tools
- process planning
- reliability analysis
- data model
- capsule endoscopy
- hardware and software
- cad systems
- neural network
- fault diagnosis
- design process
- signal processing
- computer vision