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Design-for-Test Circuit for the Reduced Code Based Linearity Test Method in Pipelined ADCs with Digital Error Correction Technique.

Jin-Fu LinSoon-Jyh ChangChih-Hao Huang
Published in: Asian Test Symposium (2009)
Keyphrases
  • error correction
  • error correcting
  • circuit design
  • error control
  • error detection
  • phase locked loop