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Globally Reliable Variation-Aware Sizing of Analog Integrated Circuits via Response Surfaces and Structural Homotopy.
Trent McConaghy
Georges G. E. Gielen
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
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integrated circuit
three dimensional
structural information
free form
electron beam
signal processing
highly accurate
circuit design
structural analysis
cost effective
image processing
surface reconstruction
range data
surface model
printed circuit boards
medical images
analog vlsi