How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing.
Marzieh KhakifiroozMahdi FathiPublished in: UbiComp/ISWC Adjunct (2020)
Keyphrases
- visual inspection
- defect detection
- tft lcd
- thin film transistor
- image analysis
- stock price
- goal programming
- quality control
- feature extraction
- supply chain
- manufacturing systems
- liquid crystal displays
- laser scanning
- fluorescence microscopy images
- decision making
- image reconstruction
- low resolution
- face recognition
- neural network