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An Integrated Stepwise Tunable Optical mm-wave Beam Former with Doubled Delay Resolution.
X. Zhang
M. Zhao
Y. Lei
K. A. Williams
Xaveer J. M. Leijtens
Y. Jiao
S. Huang
Zizheng Cao
A. M. J. Koonen
Published in:
ECOC (2018)
Keyphrases
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cross section
electron beam
electron beam lithography
low resolution
consequence finding
image processing
high resolution
rms error
reinforced concrete
neural network
critical path
waveguide
sampling rate
optical networks
packet switching