A Simulation-Based Method for Generating Tests for Sequential Circuits.
Kwang-Ting ChengVishwani D. AgrawalErnest S. KuhPublished in: IEEE Trans. Computers (1990)
Keyphrases
- cost function
- experimental evaluation
- high precision
- test data
- detection method
- objective function
- optimization algorithm
- computationally efficient
- optimization method
- classification method
- mathematical model
- theoretical analysis
- maximum likelihood
- classification accuracy
- significant improvement
- image quality
- neural network
- input data
- support vector machine svm
- mutual information
- detection algorithm
- high speed
- error rate
- synthetic data
- segmentation method
- computational cost
- computational complexity
- multiscale