CAD-guided automated nanoassembly using atomic force microscopy-based nonrobotics.

Heping Chen Ning Xi Guangyong Li

Published in: IEEE Trans Autom. Sci. Eng. (2006)

Keyphrases

atomic force microscopy
computer aided
computer assisted
fully automated
computer aided design
preprocessing
semi automated
neural network
information retrieval
computer vision
objective function
multiresolution
semi automatic