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IVF: Characterizing the Vulnerability of Microprocessor Structures to Intermittent Faults.

Songjun PanYu HuXiaowei Li
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
  • model based diagnosis
  • fault diagnosis
  • high speed
  • real world
  • multiscale
  • control system
  • fault detection
  • fault model
  • special purpose hardware