Constrained Epsilon-Minimax Test for Simultaneous Detection and Classification.
Lionel FillatrePublished in: IEEE Trans. Inf. Theory (2011)
Keyphrases
- neyman pearson
- automatic classification
- pattern classification
- classification accuracy
- feature extraction and classification
- support vector
- pattern recognition
- detection method
- support vector machine svm
- anomaly detection
- classification scheme
- image classification
- machine learning
- feature selection
- training set
- text classification
- classification process
- classification systems
- detection rate
- automatic detection
- feature extraction
- neural network
- object detection
- support vector machine classifier
- type ii
- detection accuracy
- decision trees
- statistical tests
- classification models
- preprocessing
- detection algorithm
- feature space
- data sets
- feature set
- supervised learning