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Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations.

Bishnu Prasad DasJanakiraman ViraraghavanBharadwaj AmruturH. S. JamadagniN. V. Arvind
Published in: VLSI Design (2008)
Keyphrases
  • complex systems
  • prior knowledge
  • lightweight
  • statistical models
  • data sets
  • learning algorithm
  • probabilistic model
  • parameter estimation
  • field effect transistors
  • leakage current