Optimization objectives and models of variation for statistical gate sizing.
Matthew R. GuthausNatesan VenkateswaranVladimir ZolotovDennis SylvesterRichard B. BrownPublished in: ACM Great Lakes Symposium on VLSI (2005)
Keyphrases
- statistical models
- statistical methods
- probabilistic model
- statistical modeling
- search engine
- statistical measures
- statistical inference
- data driven
- model selection
- multiple objectives
- parameter estimation
- response surface
- statistical tests
- database
- optimization problems
- evolutionary algorithm
- information retrieval