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Exploring linear structures of critical path delay faults to reduce test efforts.

Shun-Yen LuPei-Ying HsiehJing-Jia Liou
Published in: ICCAD (2006)
Keyphrases
  • critical path
  • job shop scheduling problem
  • test cases
  • fault diagnosis
  • built in self test
  • scheduling problem
  • knapsack problem
  • benchmark problems