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Effects of different drop test conditions on board-level reliability of chip-scale packages.
Yi-Shao Lai
Po-Chuan Yang
Chang-Lin Yeh
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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low cost
high speed
scale space
higher level
highly reliable
case study
test cases
small scale
vlsi implementation
learning algorithm
image processing
statistical significance