A Note on Polynomial Identity Testing for Depth-3 Circuits.

Vikraman Arvind Abhranil Chatterjee Rajit Datta Partha Mukhopadhyay

Published in: CoRR (2018)

Keyphrases

high speed
depth information
neural network
depth map
analog circuits
data sets
machine learning
information retrieval
knowledge base
test cases
personal information
digital circuits
delay insensitive
tunnel diode