Syndrome Signature in Output Compaction for VLSI Built-in Self-Test.

Sunil R. Das Nita Goel Wen-Ben Jone Amiya R. Nayak

Published in: VLSI Design (1998)

Keyphrases

signal processing
built in self test
input data
signature verification
vlsi implementation
genetic algorithm
digital signature
vlsi design
vlsi circuits
social networks
information systems
image segmentation