Chaining and Biasing: Test Generation Techniques for Shared-Memory Verification.
Gabriel A. G. AndradeMarleson GrafLuiz C. V. dos SantosPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
- test generation
- shared memory
- symbolic execution
- test cases
- message passing
- parallel algorithm
- distributed memory
- parallel computing
- multi processor
- static analysis
- quality assurance
- parallel programming
- address space
- software testing
- parallel execution
- test data generation
- shared memory multiprocessor
- similarity measure
- parallel architectures
- parallel architecture
- parallel machines
- development process
- databases
- shared memory multiprocessors
- parallel tree search