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Radiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors.

Carmen AltanaLucia CalcagnoCaterina CiampiFrancesco La ViaGaetano LanzaloneAnnamaria MuoioGabriele PasqualiDomenico PellegrinoSebastiana PugliaGiuseppe RapisardaSalvatore Tudisco
Published in: Sensors (2023)
Keyphrases
  • low cost
  • high speed
  • high density
  • object detection
  • silicon dioxide
  • liquid crystal
  • transmission electron microscopy
  • image processing
  • database systems
  • multiscale
  • markov chain
  • feature points
  • x ray
  • infrared
  • steady state