Deep Open-Set Recognition for Silicon Wafer Production Monitoring.
Luca FrittoliDiego CarreraBeatrice RossiPasqualina FragnetoGiacomo BoracchiPublished in: CoRR (2022)
Keyphrases
- semiconductor manufacturing
- recognition accuracy
- recognition rate
- monitoring system
- real time
- automatic recognition
- object recognition
- manufacturing process
- recognition algorithm
- low cost
- integrated circuit
- high speed
- visual recognition
- activity recognition
- recognition process
- human activities
- high density
- character recognition
- pattern recognition
- feature extraction
- neural network
- image recognition
- partial occlusion
- steady state
- action recognition
- hidden markov models
- shape recognition