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Reliability of Physical Unclonable Function under Temperature and Supply Voltage Variations.

Manpreet KaurRashid RashidzadehRoberto Muscedere
Published in: MWSCAS (2018)
Keyphrases
  • real time
  • machine learning
  • image sequences
  • artificial neural networks
  • reliability analysis
  • reliability assessment
  • database
  • genetic algorithm
  • case study
  • multiscale
  • piecewise linear
  • weibull distribution