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Reliability aware yield improvement technique for nanotechnology based circuits.
Costas Argyrides
Giorgos Dimosthenous
Dhiraj K. Pradhan
Carlos Arthur Lang Lisbôa
Luigi Carro
Published in:
SBCCI (2009)
Keyphrases
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quantum computing
high speed
reliability analysis
computational intelligence
digital circuits
database
databases
social networks
decision trees
highly reliable