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Measurement of digital noise in mixed-signal integrated circuits.
Keiko Makie-Fukuda
Takafumi Kikuchi
Tatsuji Matsuura
Masao Hotta
Published in:
IEEE J. Solid State Circuits (1995)
Keyphrases
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integrated circuit
mixed signal
low power
multi channel
vlsi circuits
digital circuits
low cost
power consumption
cmos technology
measurement error
high speed
signal to noise ratio
electron beam
low voltage
missing data
digital signal processing
data flow
analog to digital converter