RTL level trace signal selection and coverage estimation during post-silicon validation.

Binod Kumar Kanad Basu Masahiro Fujita Virendra Singh

Published in: HLDVT (2017)

Keyphrases

high speed
estimation algorithm
signal processing
original signal
neural network
low cost
higher level
non stationary
high frequency
levels of abstraction
data sets
x ray
low power
selection strategy
selection criterion