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RTL level trace signal selection and coverage estimation during post-silicon validation.
Binod Kumar
Kanad Basu
Masahiro Fujita
Virendra Singh
Published in:
HLDVT (2017)
Keyphrases
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high speed
estimation algorithm
signal processing
original signal
neural network
low cost
higher level
non stationary
high frequency
levels of abstraction
data sets
x ray
low power
selection strategy
selection criterion