Embedded deterministic test.

Janusz Rajski Jerzy Tyszer Mark Kassab Nilanjan Mukherjee

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)

Keyphrases

multiscale
embedded systems
digital images
three dimensional
preprocessing
hidden markov models
low cost
test data
watermarking algorithm
control software