Probabilistic bounds for complete scanning in non-raster atomic force microscopy.
Peter I. ChangSean B. AnderssonPublished in: CDC/ECC (2011)
Keyphrases
- atomic force microscopy
- upper bound
- probabilistic model
- generative model
- upper and lower bounds
- lower bound
- bayesian networks
- binary images
- uncertain data
- image processing
- probabilistic logic
- hidden markov models
- data structure
- data driven
- real time
- conditional probabilities
- context sensitive
- vc dimension
- probability theory
- probabilistic approaches
- information systems