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A Practical Analog BIST Cooperated with an LSI Tester.
Takanori Komuro
Naoto Hayasaka
Haruo Kobayashi
Hiroshi Sakayori
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2006)
Keyphrases
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latent semantic indexing
signal processing
test cases
practical application
data sets
analog vlsi
neural network
real world
image sequences
text retrieval
black box
circuit design
digital circuits