Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images.
Deruo ChengYiqiong ShiTong LinBah-Hwee GweeKar-Ann TohPublished in: IEEE Trans. Circuits Syst. II Express Briefs (2018)
Keyphrases
- support vector machine
- segmentation method
- fully automatic
- classification method
- test images
- similarity measure
- support vector machine svm
- synthetic and real images
- vanishing points
- training set
- principal components
- input image
- three dimensional
- image regions
- image classification
- image database
- image data
- medical images
- feature set
- edge detection
- feature vectors
- machine learning
- ccd camera
- hessian matrix