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Deruo Cheng
ORCID
Publication Activity (10 Years)
Years Active: 2018-2024
Publications (10 Years): 11
Top Topics
Deep Learning
Image Analysis
Integrated Circuit
Hessian Matrix
Top Venues
IEEE Trans. Circuits Syst. II Express Briefs
IEEE Intell. Syst.
ISCAS
ICIP
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Publications
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Xuenong Hong
,
Zilong Hu
,
Han Zhang
,
Yee-Yang Tee
,
Tong Lin
,
Yiqiong Shi
,
Deruo Cheng
,
Bah-Hwee Gwee
MLConnect: A Machine Learning Based Connection Prediction Framework for Error Correction in Recovered Circuit.
ISCAS
(2024)
Yee-Yang Tee
,
Deruo Cheng
,
Yiqiong Shi
,
Tong Lin
,
Bah-Hwee Gwee
Integrated Circuit Mask-Generative Adversarial Network for Circuit Annotation With Targeted Data Augmentation.
IEEE Intell. Syst.
39 (1) (2024)
Yee-Yang Tee
,
Xuenong Hong
,
Deruo Cheng
,
Chye-Soon Chee
,
Yiqiong Shi
,
Tong Lin
,
Bah-Hwee Gwee
Patch-Based Adversarial Training for Error-Aware Circuit Annotation of Delayered IC Images.
IEEE Trans. Circuits Syst. II Express Briefs
70 (9) (2023)
Deruo Cheng
,
Yiqiong Shi
,
Yee-Yang Tee
,
Jingsi Song
,
Xue Wang
,
Bihan Wen
,
Bah-Hwee Gwee
Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards.
AICAS
(2023)
Yee-Yang Tee
,
Deruo Cheng
,
Chye-Soon Chee
,
Tong Lin
,
Yiqiong Shi
,
Bah-Hwee Gwee
Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis.
CoRR
(2022)
Deruo Cheng
,
Yiqiong Shi
,
Tong Lin
,
Bah-Hwee Gwee
,
Kar-Ann Toh
Delayered IC image analysis with template-based Tanimoto Convolution and Morphological Decision.
IET Circuits Devices Syst.
16 (2) (2022)
Ling Huang
,
Deruo Cheng
,
Xulei Yang
,
Tong Lin
,
Yiqiong Shi
,
Kaiyi Yang
,
Bah-Hwee Gwee
,
Bihan Wen
Joint Anomaly Detection and Inpainting for Microscopy Images Via Deep Self-Supervised Learning.
ICIP
(2021)
Deruo Cheng
,
Yiqiong Shi
,
Tong Lin
,
Bah-Hwee Gwee
,
Kar-Ann Toh
Global Template Projection and Matching Method for Training-Free Analysis of Delayered IC Images.
ISCAS
(2019)
Deruo Cheng
,
Yiqiong Shi
,
Bah-Hwee Gwee
,
Kar-Ann Toh
,
Tong Lin
A Hierarchical Multiclassifier System for Automated Analysis of Delayered IC Images.
IEEE Intell. Syst.
34 (2) (2019)
Deruo Cheng
,
Yiqiong Shi
,
Tong Lin
,
Bah-Hwee Gwee
,
Kar-Ann Toh
Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images.
IEEE Trans. Circuits Syst. II Express Briefs
(12) (2018)
Xuenong Hong
,
Deruo Cheng
,
Yiqiong Shi
,
Tong Lin
,
Bah-Hwee Gwee
Deep Learning for Automatic IC Image Analysis.
DSL
(2018)