New Developments in SiGe HBT Reliability for RF Through mmW Circuits.

John D. Cressler

Published in: IRPS (2021)

Keyphrases

image reconstruction
mixed signal
vlsi circuits
radio frequency
high speed
thin film
failure rate
multi channel
paradigm shift
delay insensitive
artificial intelligence
low power
data mining
highly reliable
digital circuits
reliability analysis
asynchronous circuits
logic circuits
information systems
logic synthesis