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Spatially Multiplexed Micro-Spectrophotometry in Bright Field Mode for Thin Film Characterization.

Valerio PiniPriscila M. KosakaJosé J. RuzOscar MalvarMario EncinarJavier TamayoMontserrat Calleja
Published in: Sensors (2016)
Keyphrases
  • thin film
  • high density
  • short circuit
  • electron microscopy
  • multi layer
  • structured light
  • grain size
  • neural network
  • x ray
  • closed loop
  • room temperature
  • solar cell