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Parametric FE-approach to flip-chip reliability under various loading conditions.
Bernhard Wunderle
Wolfgang Nüchter
Andreas Schubert
Bernd Michel
Herbert Reichl
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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loading conditions
material properties
finite element
operating conditions
high speed
soft tissue
finite element model
finite element analysis
expert systems
pulse width modulation
medical images
steady state
control strategy
neural network controller
output voltage