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Synthesis of Sequential Circuits for Robust Path Delay Fault Testability.

Sandeep BhatiaNiraj K. Jha
Published in: VLSI Design (1993)
Keyphrases
  • analog circuits
  • fault diagnosis
  • data sets
  • fault detection
  • neural network
  • high speed
  • computationally efficient
  • face recognition
  • hidden markov models
  • asynchronous circuits
  • electronic circuits
  • fault models