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Ageing of SiC JFET transistors under repetitive current limitation conditions.
M. Bouarroudj-Berkani
D. Othman
Stéphane Lefebvre
S. Moumen
Zoubir Khatir
T. Ben Sallah
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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sufficient conditions
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special case
power consumption
high density