Local diagonal extrema number pattern: A new feature descriptor for face recognition.

Arvind PillaiRajkumar SoundrapandiyanSwapnil SatapathySuresh Chandra SatapathyKi-Hyun JungRajakumar Krishnan
Published in: Future Gener. Comput. Syst. (2018)
Keyphrases
  • face recognition
  • feature descriptors
  • local binary pattern
  • pattern recognition
  • viewpoint
  • ground truth
  • post processing
  • feature distributions