Tomographic Testing and Validation of Probabilistic Circuits.
Alexandru PalerArmin AlaghiIlia PolianJohn P. HayesPublished in: ETS (2011)
Keyphrases
- bayesian networks
- model based testing
- high speed
- uncertain data
- probabilistic model
- test data
- test cases
- generative model
- asynchronous circuits
- circuit design
- artificial intelligence
- learning algorithm
- data driven
- software development
- artificial neural networks
- probabilistic reasoning
- software testing
- probabilistic logic
- training data
- tomographic reconstruction
- database systems